Files
codebase-memory-mcp/tests
Andrew Hundt 1b9b4ebb26 feat(store): drain ready overlay compactions
Add a bounded store helper that repeatedly reuses compact_next for ready overlay generations. A named CBM_STORE_COMPACT_ALL_GENERATIONS constant documents the drain-all mode, while positive limits cap the number of generations compacted by one API call.

Cover no-ready drain behavior and a two-overlay canary that proves a one-generation limit leaves later ready overlays visible for a subsequent drain. This prepares the future background worker to reuse one store path instead of duplicating compaction loops.

Validation: make -f Makefile.cbm -j8 build/c/test-runner; CBM_ONLY_SUITE=store_nodes build/c/test-runner (105 passed); git diff --check; scripts/check-source-safety.sh src/store/store.c src/store/store.h tests/test_store_nodes.c; make -f Makefile.cbm -j8 cbm.
Signed-off-by: Andrew Hundt <ATHundt@gmail.com>
2026-07-04 04:14:26 -04:00
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2026-06-03 02:13:30 +02:00